Test data truncation for test quality maximisation under ATE memory depth constraint
نویسندگان
چکیده
منابع مشابه
Test data truncation for test quality maximisation under ATE memory depth constraint
Testing is used to ensure production of high quality integrated circuits. High test quality implies the application of high quality test data; however, technology development has led to a need to increase test data volumes to ensure high test quality. The problem is that the high test data volume leads to long test application times and high automatic test equipment memory requirement. For a mo...
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ژورنال
عنوان ژورنال: IET Computers & Digital Techniques
سال: 2007
ISSN: 1751-8601
DOI: 10.1049/iet-cdt:20050209