Test data truncation for test quality maximisation under ATE memory depth constraint

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Test data truncation for test quality maximisation under ATE memory depth constraint

Testing is used to ensure production of high quality integrated circuits. High test quality implies the application of high quality test data; however, technology development has led to a need to increase test data volumes to ensure high test quality. The problem is that the high test data volume leads to long test application times and high automatic test equipment memory requirement. For a mo...

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ژورنال

عنوان ژورنال: IET Computers & Digital Techniques

سال: 2007

ISSN: 1751-8601

DOI: 10.1049/iet-cdt:20050209